Researchers use Santec SPA-100 component analyzer for complex SiPh waveguide analysis.

Researchers use Santec SPA-100 component analyzer for complex SiPh waveguide analysis.

Yokohama National University researchers have recently published a paper detailing their meticulous troubleshooting and analysis of an FMCW LiDAR device they're actively developing. This innovative device is built using silicon photonic waveguides and its compact design makes diagnosing malfunctions challenging.

To address this complexity and precisely identify potential issues within the device, the research team opted to employ a high-resolution reflectometer, namely the SPA-100 Swept Photonics Analyzer, based on optical frequency domain reflectometry (OFDR) technology. Its exceptional precision, with a resolution of less than 4 micrometers in silicon, proved invaluable in analyzing the device structure and pinpointing areas exhibiting unwanted reflections or high insertion loss.

Learn the details of how these researchers used this advanced instrument to troubleshoot unwanted noise within the device and ensure the verification of critical design properties, offering valuable insights into the optimization of this cutting-edge technology.

Download the paper here: OFDR analysis of Si photonics FMCW LiDAR chip