Santec’s Swept Test System has been developed to streamline photonic testing, providing a complete solution where high-speed analysis, high resolution and accuracy are key. Combining one of Santec’s tunable lasers (TSL-770 or TSL-570) with an optical power meter (MPM-210H), a polarization control units (PCU-110) and custom software, the complete Swept Test System optimizes WDL and PDL measurement for use in both R&D and production environments.
Using real-time referencing, while simultaneously acquiring output power from the tunable laser and the transmitted optical power through the DUT, the system provides high accuracy in WDL and PDL analysis using the Mueller Matrix Method. Over-sampling and rescaling algorithms are used to maximize testing throughput while maintaining measurement integrity.
The Santec MPM-210H power meter mainframe can be used in conjunction with the 4-channel current meter module, the MPM-213. The Swept Test System combined with the MPM-210H and MPM-213 is suitable for measuring the performance of fiber optics components using transceiver-like photodiodes (ROSA/Coherent receiver, etc.) or optical channel monitors.
Accurate WDL/PDL Measurements
Power repeatability <+/- 0.02 dB PDL repeatability +/- 0.01 dB
Short Measurement Time
Rescaling algorithm allows for high wavelength accuracy and reduced measurement time
Multichannel Measurements
Modules allow up to 20 channels per chassis
Exclusive Software and DLLs
Automated operation using Santec's exclusive software or available DLLs
Optical characterization of components and modules: - Tunable Filters, Interleavers, Fiber Bragg Gratings, Couplers, Splitters, Isolators, Switches, etc - WSS and Wavelength Blockers - DWDM components
Silicon photonic material characterization, including micro-cavity ring resonators
Spectroscopy
Interferometry
WDL (Wavelength Dependent Loss) Measurement
High dynamic range measurement of 80 dB or more
The Santec tunable laser source TSL series have been outfitted with an innovative cavity design to lower the optical ASE noise, resulting in an extraordinarily high signal-to-noise ratio of over 90 dB / 0.1 nm, while also maintaining a high output power of over + 10 dBm. The TSL series lasers are ideal for next generation components testing driven by innovations in Dense Wavelength Division Multiplexing (DWDM), passives and Wavelength Selective Switches (WSS). The following graphs show the measurement data of a CWDM filter and notch filter, (such as an FBG) respectively.
High wavelength accuracy +/- 3 pm
The Santec tunable laser source TSL series has been equipped with the wavelength monitor as standard, so is ideal for high precision testing of optical passive components. A measurement accuracy of less than a few pm can be confirmed by measuring the absorption lines of Acetylene (12C2H2) gas cell.
High wavelength resolution less than 0.1 pm
The Santec Swept Test System can measure not only WDL measurements of optical components (including Dense Wavelength Division Multiplexing (DWDM), AWG, Wavelength Selective Switches (WSS) and more), but also very narrow filters (i.e., High Q cavity devices) efficiently with high resolution, even during continuous sweeps.
Configuration
Polarization Dependent Loss Measurement
Tunable Laser TSL-770 / TSL-570
Polarization Controller PCU-110
Optical Power Meter MPM-210H
Wavelength Dependent Loss Measurement
Tunable Laser TSL-770 / TSL-570
Optical Power Meter MPM-210H
Multi-station Measurement
In the multi-station measurement configuration, the TSL, PCU and MBU will act as a server that splits the trigger signal and light beam to different stations. Each station will consist of a client PC and a power meter. During operation, the TSL will sweep continuously allowing each station to work independently and simultaneously with other stations. In this way, the Multi-station measurement configuration can improve the efficiency of measurements for high-accuracy characterization and analysis.
