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  • STS

Swept Test System

  • Real-time power referencing 
  • Accurate WDL / PDL characteristics measurement 
  • High power repeatability < ±0.02 dB
  • High PDL repeatability ±0.03 dB
  • High wavelength resolution and accuracy 
  • Multichannel measurement is available
  • Convenient set up of measurement parameters 
  • Data analysis


Santec’s Swept Test System has been developed to streamline photonic testing, providing a complete solution where high-speed analysis, high resolution and accuracy are key. Combining one of Santec’s tunable lasers (TSL-770 or TSL-570) with an optical power meter (MPM-210H), a polarization control units (PCU-110) and custom software, the complete Swept Test System optimizes WDL and PDL measurement for use in both R&D and production environments.

Using real-time referencing, while simultaneously acquiring output power from the tunable laser and the transmitted optical power through the DUT, the system provides high accuracy in WDL and PDL analysis using the Mueller Matrix Method. Over-sampling and rescaling algorithms are used to maximize testing throughput while maintaining measurement integrity.

The Santec MPM-210H power meter mainframe can be used in conjunction with the 4-channel current meter module, the MPM-213. The Swept Test System combined with the MPM-210H and MPM-213 is suitable for measuring the performance of fiber optics components using transceiver-like photodiodes (ROSA/Coherent receiver, etc.) or optical channel monitors.

Accurate WDL/PDL Measurements

Power repeatability <+/- 0.02 dB
PDL repeatability +/- 0.01 dB

Short Measurement Time

Rescaling algorithm allows for high wavelength accuracy and reduced measurement time

Multichannel Measurements

Modules allow up to 20 channels per chassis

Exclusive Software and DLLs

Automated operation using Santec's exclusive software or available DLLs


Decades of experience to meet your custom needs


Swept Test System Introduction Video

2 min watch

Swept Test System Connect Tutorial [PDL]

3 minute watch

Swept Test System Connect tutorial [WDL]

3 minute watch


  • Optical characterization of components and modules:
    - Tunable Filters, Interleavers, Fiber Bragg Gratings, Couplers, Splitters, Isolators, Switches, etc
    - WSS and Wavelength Blockers
    - DWDM components
  • Silicon photonic material characterization, including micro-cavity ring resonators
  • Spectroscopy
  • Interferometry

WDL (Wavelength Dependent Loss) Measurement

High dynamic range measurement of 80 dB or more

The Santec tunable laser source TSL series have been outfitted with an innovative cavity design to lower the optical ASE noise, resulting in an extraordinarily high signal-to-noise ratio of over 90 dB / 0.1 nm, while also maintaining a high output power of over + 10 dBm. The TSL series lasers are ideal for next generation components testing driven by innovations in Dense Wavelength Division Multiplexing (DWDM), passives and Wavelength Selective Switches (WSS). The following graphs show the measurement data of a CWDM filter and notch filter, (such as an FBG) respectively.

High wavelength accuracy +/- 3 pm

The Santec tunable laser source TSL series has been equipped with the wavelength monitor as standard, so is ideal for high precision testing of optical passive components. A measurement accuracy of less than a few pm can be confirmed by measuring the absorption lines of Acetylene (12C2H2) gas cell.

High wavelength resolution less than 0.1 pm

The Santec Swept Test System can measure not only WDL measurements of optical components (including Dense Wavelength Division Multiplexing (DWDM), AWG, Wavelength Selective Switches (WSS) and more), but also very narrow filters (i.e., High Q cavity devices) efficiently with high resolution, even during continuous sweeps.


Polarization Dependent Loss Measurement

  • Tunable Laser TSL-770 / TSL-570
  • Polarization Controller PCU-110
  • Optical Power Meter MPM-210H
Wavelength Dependent Loss Measurement

  • Tunable Laser TSL-770 / TSL-570
  • Optical Power Meter MPM-210H

Multi-station Measurement

In the multi-station measurement configuration, the TSL, PCU and MBU will act as a server that splits the trigger signal and light beam to different stations. Each station will consist of a client PC and a power meter. During operation, the TSL will sweep continuously allowing each station to work independently and simultaneously with other stations. In this way, the Multi-station measurement configuration can improve the efficiency of measurements for high-accuracy characterization and analysis.

  • Tunable Laser TSL-570
  • Polarization Controller PCU-110
  • Multi-Branch Unit MBU-100
  • Optical Power Meter MPM-210H
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