Wide Tuning Range
Isolated drive mechanism allows for mode-hop-free tuning range of 160 nm
- TSL-770
Ultimate Performance Tunable Laser
Our highest accuracy, fastest tuning, lowest noise, and narrowest linewidth laser
- 200 nm/s rapid sweep
- Linewidth <60 kHz
- <1/10 frequency fluctuation (vs. conventional model)
- Fine tuning scan range 10 GHz
- 1480 to 1640 nm
Description
Santec has brought all its experience and knowledge gained over the past 30 years to its all-new 7th generation tunable laser.
The TSL-770 is a very high specification tunable laser with flexibility in operation to ensure suitability for a wide range of applications.
A ground up redesign of the laser cavity together with ultra-low noise electronics combine to provide market leading scan speed, high optical power, wide tuning range, low noise, and narrow linewidth in the same laser.
The new proprietary cavity design enhances Q-factor and wavelength stability enabling accurate measurements in even the most cutting-edge research applications.
01/01
High S/N and High Power
90 dB/0.1 nm S/N while still maintaining high output power of +13 dBm
Built-in High Performance Wavelength Meter
Wavelength accuracy of +/-2 pm with logging when in sweep mode
窄线宽 & 高稳定性
Narrow Linewidth & Low Jitter
Features & Characteristics
- Wide tuning range from 1480 to 1640 nm
if you require a different wavelength, please contact our sales team’
- Mode-hop-free with rapid sweeps up to 200 nm/s
- High output power >+ 13 dBm
- High signal-to-noise ratio >90 dB/0.1 nm
- High wavelength accuracy 0.3 pm(typ.)
- Narrow linewidth <60 kHz
- Wide tuning range from 1480 to 1640 nm
Typical Data
High SN / High Power
Wide Tuning Range
Narrow Linewidth
Applications
- Optical characterization of components and modules:
- Tunable filters, interleavers, Fiber Bragg gratings, couplers, splitters, isolators, switches, etc.
- WSS and wavelength blockers
- DWDM components - Silicon photonic material characterization, including micro-cavity ring resonators
- Spectroscopy
- Quantum dots
- Optical characterization of components and modules:
